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Anritsu to Conduct LTE Demonstration with Samsung Device at MWC

14-02-2010
 

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Anritsu Corporation (Hall 1, stand B31) announces its demonstration with Samsung Electronics’ LTE USB Modem at Barcelona Mobile World Congress (MWC) held February 15 - 18.

LTE is the next-generation, high-speed, mobile wireless technology planned for rollout in 2010 by the world’s leading operators. Anritsu has been working with Samsung Electronics as a primary test vendor to help Samsung Electronics prove its LTE capable devices.

Anritsu and Samsung Electronics have been jointly testing Samsung’s world-leading LTE device. Together, they have already achieved excellent results, such as demonstrating 100 Mbps (downlink) and 50 Mbps (uplink) data throughput, and obtaining R&TTE validation, Europe’s radio regulatory requirement, using Anritsu’s LTE radio frequency conformance test system.

At the MWC, Anritsu will be demonstrating its LTE solutions, including the MT8820C Radio Communication Analyzer, a next-generation one box tester, and TS36.521 RF conformance tests with the ME7873L LTE radio frequency conformance test system using Samsung’s LTE devices.

LTE Exhibits

MD8430A --  LTE Signaling Tester (e-NodeB Simulator)
RTD -- Rapid Test Designer (test script editing and execution software)
ME7832L -- LTE Protocol Conformance Test System
ME7873L -- LTE RF Conformance Test System
MT8820C -- Radio Communication Analyzer
MS2830A -- Signal Analyzer

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