Login
  United States

LTE

 
Long Term Evolution – LTE/LTE-Advanced

LTE (Long Term Evolution) is the established next generation mobile technology, with many legacy systems and variants being integrated into operator network upgrades. The challenge for wireless device developers is to offer the right services and be able to support a variety of systems to ensure their devices can connect globally on any mobile network.


LTE addresses some of the key issues in the network:


  • Spectrum Flexibility and Efficiency
  • New Service Capabilities
  • Faster Data Rates
ME7873L
LTE RF Conformance Test System

The ME7873L LTE RF Conformance Test System is the world’s first GCF-validated RF test platform (test cases validated at CAG #22 in April 2010), supporting the most GCF-approved test cases. The system uses the MD8430A Signaling Tester as an LTE network simulator and is configured using Anritsu-developed test instruments, interface hardware, and software. The ME7873L supports TRx, Performance, and RRM test cases with the UE in either a test call or no-call test mode. LTE Bands currently supported include FDD 1 to 5, 7 to 14, 17 to 21, 24 to 29, and TDD 33 to 41.


ME7834
Mobile Device Test Platform

The Mobile Device Test Platform ME7834 is an all-in-one platform supporting multisystem mobile terminal protocol conformance tests and carrier acceptance tests. In addition to supporting stand-alone tests of W-CDMA and LTE systems, the ME7834 can also be configured as a customized integrated environment for Inter-RAT tests between LTE, GSM, W-CDMA, CDMA2000 and TD-SCDMA mobile systems.


MX786201A
Rapid Test Designer (RTD)

Rapidly Test Mobile Device Signaling

Fixing problems early is a business goal for any wireless product development organization and correctly implementing protocols the first time round will reduce cost and improve product quality. In order to meet these goals you will need to hire world-class engineers and equip them with the most effective development tools and test solutions.

The Rapid Test Designer (RTD), coupled with Anritsu’s preeminent range of mobile system simulators has been adopted by the world’s leading device makers and network operators as the unsurpassed solution for rapidly testing and debugging wireless mobile device signaling.


MD8430A
Signalling Tester (Base Station Simulator)

Wireless devices are evolving quickly into multimedia smartphones with fast data connections due to widespread deployment of high-speed standards, such as LTE. The MD8430A Signalling Tester is a key LTE base station simulator for developing 3GPP LTE/LTE-Advanced compliant chipsets and wireless devices. In addition to verifying normal communications procedures, it supports fault operation tests, which are difficult to perform at connection with live base stations. It also supports LTE terminal R&D and verification tests under various conditions. Based on extensive experience in 3G markets, Anritsu has developed the MD8430A as a powerful LTE protocol/R&D test solution to help developers bring LTE wireless devices to market as soon as possible.


MD8475A
Signalling Tester (Base Station Simulator)

The Signalling Tester MD8475A is an all-in-one base station simulator supporting LTE, LTE-Advanced, W-CDMA/HSPA/HSPA Evolution/DC-HSDPA, GSM/EGPRS, CDMA2000 1X/1xEV-DO Rev. A and TD-SCDMA/TD-HSPA. It supports service, VoLTE and call-processing tests for multimode LTE smartphones and mobiles with excellent cost-performance.
MF6900A
Fading Simulator

The MF6900A Fading Simulator connects to the MD8430A Signalling Tester via a dedicated digital interface to easily simulate an LTE base station and run fading simulation tests required by 3GPP LTE 2x2 MIMO and 4x2 MIMO tests.


MT8820C
Radio Communication Analyzer

The Radio Communication Analyzer MT8820C platform covers 30 MHz to 2.7 GHz (3.4 GHz to 3.8 GHz valid only if MT8820C–018 is installed). Installing optional software and hardware supports evaluation of key TRx characteristics for LTE–Advanced FDD ⁄ TDD DL CA, LTE FDD ⁄ TDD, W–CDMA ⁄ HSPA ⁄ HSPA Evolution ⁄ DC–HSPA ⁄ 4C–HSDPA, CDMA2000 1X ⁄ 1xEV–DO, TD–SCDMA ⁄ TD–HSPA ⁄ TD–HSDPA Evolution, GSM ⁄ GPRS ⁄ EGPRS, and PHS ⁄ ADVANCED PHS terminals.


MT8870A
Universal Wireless Test Set

The MT8870A Universal Wireless Test Set has been specifically designed for the high volume manufacturing test of all common cellular and short range wireless technologies. An MT8870A instrument mainframe can contain up to four MU887000A TRX test modules each capable of independent control by an external PC. Each module has an integrated Vector Signal Generator (VSA) and Vector Signal Analyzer (VSA) to perform both transmitter and receiver RF tests. The MT8870A with the MU887000A test module can be controlled by an external PC.
MS2830A
Spectrum Analyzer/Signal Analyzer

The MS2830A is a spectrum analyzer/signal analyzer with top-class measurement speed at medium-class price. It has best-of-class dynamic range (average noise level [DANL]: –153 dBm, third-order intermodulation distortion [TOI]: +15 dBm) and excellent ±0.3 dB (typ.) total level accuracy using unique level calibration technology.


MS2830A Microwave
Spectrum Analyzer/Signal Analyzer

The MS2830A-044/045 Signal Analyzer includes a spectrum analyzer function for measuring up to 110 GHz using an external mixer based on the 26.5 GHz/43 GHz upper frequency limit. It supports measurements of Tx characteristics, including adjacent channel leakage power, spectrum mask, and frequency counter, as well as spurious measurements requiring a wide dynamic range.


MS2690A
Signal Analyzers

Signal Analysis will never be the same again

MS269xA Series Signal Analyzers are the latest high performance signal analyzers for next-generation communication applications. The MS269xA Series Signal Analyzer base units include swept spectrum analysis, FFT signal analysis, and a precision digitizer function. Add options to incorporate a Signal Generator, to turn the instrument into a hassle free, plug and play, one box solution.


MS2691A
Signal Analyzers

Signal Analysis will never be the same again

MS269xA Series Signal Analyzers are the latest high performance signal analyzers for next-generation communication applications. The MS269xA Series Signal Analyzer base units include swept spectrum analysis, FFT signal analysis, and a precision digitizer function. Add options to incorporate a Signal Generator, to turn the instrument into a hassle free, plug and play, one box solution.


MS2692A
Signal Analyzers

Signal Analysis will never be the same again

MS269xA Series Signal Analyzers are the latest high performance signal analyzers for next-generation communication applications. The MS269xA Series Signal Analyzer base units include swept spectrum analysis, FFT signal analysis, and a precision digitizer function. Add options to incorporate a Signal Generator, to turn the instrument into a hassle free, plug and play, one box solution.


MG3710A
Vector Signal Generator

The Vector Signal Generator MG3710A is a best-of-class, multi-function, signal generator with excellent RF and baseband performance. The MG3710A features wideband vector modulation and offers built-in baseband waveform generation with large-capacity memory to ensure maximum versatility. It supports all key mobile communications and wireless LAN standards, and it also has the exceptional performance required for emerging and proprietary wireless communications technologies. Dual RF and Dual Waveform options enable a single MG3710A to output up to four independently modulated signals. The MG3710A makes it easy to implement complex test scenarios that would normally require multiple synchronized signal generators, such as:
  • Wanted + Interference Signals for Receiver Blocking Testing
  • Wanted + Two CW Tones for Receiver Intermodulation Testing
  • Wanted + Delayed Signals for Multipath Testing
  • Multiple Wanted Signals for MIMO Testing
  • Multiple Wanted Signals for LTE-Advanced Carrier Aggregation Testing

MS2712E
9 kHz to 4 GHz

Regulatory requirements are growing. You're under increasing pressure to cut costs. And improving system uptime is always a top priority. The MS2712E Spectrum Master helps you do all of this and more. Whether you are performing complex interference analysis or assessing signal quality, the MS2712E Spectrum Master delivers the ease of use, rich functionality, and best-in-class price/performance you've come to expect from Anritsu.

MS2713E
9 kHz to 6 GHz

Regulatory requirements are growing. You're under increasing pressure to cut costs. And improving system uptime is always a top priority. The MS2713E Spectrum Master helps you do all of this and more. Whether you are performing complex interference analysis or assessing signal quality, the MS2713E Spectrum Master delivers the ease of use, rich functionality, and best-in-class price/performance you've come to expect from Anritsu.

MS2720T
9 kHz - 43 GHz

Anritsu's latest generation of handheld spectrum analyzers is the MS2720T Spectrum Master. This represents the company's highest performance handheld spectrum analyzer. Exciting new features and options bring more value and speed to the user.
MT8212E
100 KHz to 4 GHz Spectrum Analyzer
2 MHz to 4.0 GHz Cable & Antenna Analyzer

360 Degree View of MT8212E

The MT8212E Cell Master™ Base Station Analyzer is the smallest, lightest, and most economical solution for 2G/3G/4G, and WiMAX base station transmitter testing and ISDB-T and DVB-T/H digital broadcast field testing. It's ideal for installation and commissioning as well as for maintenance and troubleshooting.

MT8213E
100 KHz to 6 GHz Spectrum Analyzer
2 MHz to 6.0 GHz Cable & Antenna Analyzer

The MT8213E Cell Master™ Base Station Analyzer is the smallest, lightest, and most economical solution for 2G/3G/4G, and WiMAX base station transmitter testing and ISDB-T and DVB-T/H digital broadcast field testing. It's ideal for installation and commissioning as well as for maintenance and troubleshooting.

MT8220T
BTS Master 150 kHz to 7.1 GHz Spectrum Analyzer

The BTS Master MT8220T is Anritsu’s third generation high-performance handheld base station analyzer that has been specifically developed to advance the support for 4G wireless networks as well as installed 2G, 3G and WiMAX networks. The MT8220T provides 20 MHz bandwidth modulation quality for LTE eNodeB testing and is equipped with a high-contrast, touch screen display and backlit key panel making it simple to use in both bright sunlight and dim conditions.
MX829000A
SweepMasters Pro web-based line sweep and tracking tool

SweepMasters Pro is a web-based line sweep and tracking tool for large multi cell-site installation and maintenance projects.


MX829001A
SweepMasters Pro web-based line sweep and tracking tool with enhanced document capture capabilities

The SweepMasters Pro Plus is Anritsu's advanced enterprise level solution for efficient tracking and management of building, maintenance, and operations processes for a wireless network, which inherently generates large numbers of traces, documents, and reports.


ML2437A
90 dB Dynamic Range

The ML2437A Power Meter combines the advantages of thermal meter accuracy, diode meter speed, and peak power meter display graphics. The result is a single instrument that samples at more than 35K per second and achieves 90 dB dynamic range with a single sensor. This meter includes graphics display capability as a standard feature. The ruggedized housing and optional high-capacity NiMH battery bring laboratory quality accuracy to field service applications. ML2437A has one input.


ML2438A
ML2438A

The ML2438A Power Meter combines the advantages of thermal meter accuracy, diode meter speed, and peak power meter display graphics. The result is a single instrument that samples at more than 35K per second and achieves 90 dB dynamic range with a single sensor. This meter includes graphics display capability as a standard feature. The ruggedized housing and optional high-capacity NiMH battery bring laboratory quality accuracy to field service applications. ML2438A has two inputs.


ML2487B
Sensor Dependent

The ML2487B Wideband Peak Power Meter provides accurate peak power measurement for communications, wireless, and aerospace applications. For the design and implementation of wireless networks, they address the important issues of power control, peak power, and timing.
ML2488B
Sensor Dependent

The ML2488B Wideband Peak Power Meter provides accurate peak power measurement for communications, wireless, and aerospace applications. For the design and implementation of wireless networks, they address the important issues of power control, peak power, and timing.
ML2495A
Sensor Dependent

High resolution wide bandwidth power meter and sensor for radar, 3G, and 4G wireless applications.
The ML2495A Peak Power Meter has been designed for high resolution measurements on radar and the latest 3G and 4G wireless systems, including next-generation systems based on complex new modulation technologies such as OFDM.
ML2496A
Sensor dependent

High resolution wide bandwidth power meter and sensor for radar, 3G, and 4G wireless applications.
The ML2496A Peak Power Meter has been designed for high resolution measurements on radar and the latest 3G and 4G wireless systems, including next-generation systems based on complex new modulation technologies such as OFDM.
PSN50
50 MHz — 6 GHz

The High Accuracy Power Meter is designed to provide accurate power measurements from 50 MHz to 6 GHz for many products in the Anritsu catalog. The PSN50 is currently compatible with Site Master, Cell Master, Spectrum Master, BTS Master, VNA Master, and the MS271xB Economy Microwave Spectrum Analyzer instruments.


MA24105A
350 MHz — 4 GHz

The Anritsu MA24105A Inline Peak Power Sensor is designed to take accurate average power measurements over 2mW to 150 W, from 350 MHz to 4GHz. The sensor employs a "dual path" architecture that enables True-RMS measurements over the entire frequency and dynamic range allowing users to measure CW, multi-tone and digitally modulated signals such as GSM/EDGE, CDMA/EV-DO, WCDMA/HSDPA, WiMAX, and TD-SCDMA.


MA24106A
50 MHz to 6 GHz

The MA24106A power sensor is a USB power sensor that eliminates the need of a traditional power meter. It is a highly accurate, standalone instrument that communicates with a PC via USB. The power measurement capability of MA24106A is intended to mimic that of a traditional thermal (thermo-electric) power sensor with a wider dynamic range.


MA24108A
Frequency: 10 MHz to 8 GHz

The MA24108A power sensor is designed to provide accurate average power measurements from 10 MHz to 8 GHz over 60 dB of dynamic range. The sensor employs a "dual path" architecture that provides (similar to thermal sensor) True-RMS measurements over the entire frequency and dynamic range, enabling users to make highly accurate average power measurements for CW, multi-tone, and digitally modulated signal up to 8 GHz.


MA24118A
Frequency: 10 MHz to 18 GHz

The MA24118A power sensor is designed to provide accurate average power measurements from 10 MHz to 18 GHz over 60 dB of dynamic range. The sensor employs a "dual path" architecture that provides (similar to thermal sensor) True-RMS measurements over the entire frequency and dynamic range, enabling users to make highly accurate average power measurements for CW, multi-tone, and digitally modulated signal up to 18 GHz.


MA24126A


The MA24126A power sensor is designed to provide accurate average power measurements from 10 MHz to 26 GHz over 60 dB of dynamic range. It employs a "dual path" architecture that provides (similar to thermal sensor) True-RMS measurements over the entire frequency and dynamic range, enabling users to make highly accurate average power measurements for CW, multi-tone, and digitally modulated signal up to 26 GHz.


MA244xD Series
10 MHz to 50 GHz

The Anritsu MA244XD standard diode sensors are designed for use with the ML2430, ML2480 and ML2490 series power meters. They are designed for high dynamic range, high accuracy CW and TDMA measurements. With their built in 3 dB attenuator, the MA244XD minimize input VSWR and are best used where the best measurement accuracy is required over a large dynamic range, for example when measuring amplifiers. These sensors have a dynamic range of 87 dB compared to the 90 dB of MA247XD standard diode sensors. In all other respects the performance of the sensors is identical to the standard diode sensor.


MA247xD Series
10 MHz to 50 GHz

The Anritsu MA247XD standard diode sensors are designed for use with the ML2430, ML2480 and ML2490 series power meters. They are designed for high dynamic range, high accuracy CW and TDMA measurements. These power sensors have 90 dB dynamic range and linearity better than 1.8% making them the choice for precision measurements. The 4 µs rise time of these sensors is fast enough for power measurements on GSM and similar TDMA systems that use GMSK modulation.


MA248xD Series
10 MHz to 18 GHz

The MA2480A series are true RMS sensors with a dynamic range of 80 dB. These power sensors can be used for average power measurements on CW, multi-tone and modulated RF waveforms such as 3G, 4G, and OFDM. The sensor architecture consists of three pairs of diodes, each one configured to work in its square law region over the dynamic range of the sensor. Therefore, it measures true RMS power regardless of the type or bandwidth of the modulation of the input signal. Option 1 provides TDMA measurement capability, calibrating one of the diode pairs for linearity over a wide dynamic range, thus making it a truly universal sensor.


MA249xA Series
50 MHz to 18 GHz

The Anritsu MA249XA wideband power sensors are designed for use with the ML2480 and ML2490 series power meters. These sensors provide peak, crest factor, average power, rise time, fall time, maximum power, minimum power and statistical data of wideband signals.


MA2411B
300 MHz to 40 GHz

The Anritsu MA2411B pulse power sensors are designed for use with the ML2480 and ML2490 series power meters. These sensors are used for pulse profiling and provide peak, crest factor, average power, rise time, fall time, maximum power, minimum power and statistical data of wideband signals.


LTE (Long Term Evolution) is the established next generation mobile technology, with many legacy systems and variants being integrated into operator network upgrades. The challenge for wireless device developers is to offer the right services and be able to support a variety of systems to ensure their devices can connect globally on any mobile network.

LTE addresses some of the key issues in the network:

  • Spectrum Flexibility and Efficiency
    • LTE supports flexible spectrum allocation. Both Frequency Division Duplex (FDD) and Time Division Duplex (TDD) are supported, as are channel bandwidths of 1.4, 3, 5, 10, and 20MHz in the available spectrum.
    • LTE interoperates with W-CDMA, GSM, and CDMA2000 systems. Multimode UEs will support handover to and from these other technologies.
    • LTE improves spectrum efficiency relative to 3GPP Release 6. The uplink and downlink channels are two to four times more spectrally efficient than High-Speed Packet Access (HSPA).
    • Carrier Aggregation provides the ability to combine across multiple carriers, multiple bands, as well as across licensed and unlicensed spectrum.

  • Faster Data Rates
    • LTE generates ten to twelve times the throughput on the downlink and 8 to 10 times the throughput on the uplink relative to 3GPP Release 6.
    • LTE-Advanced supports peak data rates of up to 450 Mbps on the downlink when using Carrier Aggregation (3 x 20 MHz channel bandwidth) with 2x2, 4x2, and 4x4 MIMO. With later releases supporting up to 5 carriers, data rates of over 1Gbps is possible.

  • New Service Capabilities
    • Voice over LTE - With LTE networks deployed all over the world, migrating traditional voice services to LTE becomes ever more pressing. GSMA IR.92 – IMS Profile for Voice and SMS – clears the way for a global solution but also introduces functional, performance, and quality test challenges. Meeting those challenges and ensuring Voice over LTE’s (VoLTE) commercial success will require comprehensive testing of VoLTE-enabled mobile devices.
    • LTE Broadcast Service – evolved Multimedia Broadcast Multicast Service (eMBMS) provides a point-to-multipoint solution enabling efficient delivery of broadcast services.

LTE (Long Term Evolution) is the established next generation mobile technology, with many legacy systems and variants being integrated into operator network upgrades. The challenge for wireless device developers is to offer the right services and be able to support a variety of systems to ensure their devices can connect globally on any mobile network.

Anritsu offers a complete line of LTE test solutions to ensure the performance and quality of your LTE devices and networks.

Mobile devices are quickly becoming fast multimedia terminals due to widespread adoption of the LTE radio communications standard. The MD8430A Signalling Tester is a key LTE base station simulator for developing LTE-compliant chipsets and mobile devices. Leveraging its extensive experience in 3G markets, Anritsu has developed the MD8430A as a powerful LTE protocol R&D test platform enabling developers bring LTE terminals to market as fast as possible.

The introduction of the LTE next-generation communication standard makes MIMO evaluation in a fading environment much more complex. Connecting the MF6900A Fading Simulator to the MD8430A Signalling Tester via dedicated digital interface to simulate a BTS greatly simplifies 3GPP LTE 2×2 MIMO and 4×2 MIMO fading tests.

LTE also drives the rollout of new smartphones. The MD8475A Network Simulator is a complete network-in-a-box, simulating the radio access as well as the core network and server functions, and supports a full range of communications standards (including LTE). SmartStudio, the user interface of the MD8475A, eliminates the need to create complex test scripts, assuring efficient and simpler mobile testing.

The ME7834L is a configurable system that provides flexible protocol test solutions throughout the lifecycle of modern wireless terminals. ME7834 systems are able to address applications in development and conformance and evolve to provide advanced system simulation. The ME7834 can be configured to provide solutions for individual applications or combinations that allow functionality to be shared or expanded as needs mature. From a simple bench-top development system, to a rack that provides comprehensive simulation of real networks, ME7834 combines hardware with tools and a framework for efficient use of resources.

The ME7873L LTE RF Conformance Test System supports the LTE frequency bands deployed worldwide, and users can choose the FDD/TDD test functions matching their test terminals. In addition, the ME7873L can be tailored to the required test environment, matching customers' RF TRX, performance, and RRM requirements, as well as minimizing their investment costs.

DL/UL Peak Rates for E-UTRA FDD/TDD (Frame Structure Type 1)


  Downlink Uplink
Assumptions 64 QAM, R=1
Signal overhead for reference signals and control channel occupying one OFDM symbol
Single TX UE, R=1
Signal overhead for reference signals and control channel occupying 2RB
Unit Mbps in 20 MHz b/s/Hz Mbps in 20 MHz b/s/Hz
Requirement 100 5.0 50 2.5
Modulation 2x2 MIMO: 172.8
4x4 MIMO: 326.4
2x2 MIMO: 8.6
4x4 MIMO: 16.3
16QAM: 57.6
64QAM: 86.4
16QAM: 2.9
64QAM: 4.3


Peak Rates for E-UTRA TDD (TD Frame Structure Type 2)


  Downlink Uplink
Assumptions 64 QAM, R=1
frame structure type 3
Single TX UE, 64QAM, R=1
frame structure type 2
Unit Mbps in 20 MHz b/s/Hz Mbps in 20 MHz b/s/Hz
Requirement 100 5.0 50 2.5
2x2 MIMO in DL 142 7.1 62.7 3.1
4x4 MIMO in DL 270 13.5    

Downlink Key Features

  • OFDM-based, 15 kHz sub-carrier spacing
  • BPSK, QPSK, 16QAM, 64QAM modulation
  • Variable RF bandwidth, 1.4 - 20 MHz
  • MIMO in the form of transmit diversity or spatial multiplexing
  • Scheduling, link adaptation, HARQ and measurements similar to 3.5G
  • MBMS
  • Carrier Aggregation
  • eICIC / FeICIC / CoMP

 

Uplink Key Features

  • Single Carrier FDMA, 15 kHz sub-carrier spacing
  • BPSK, QPSK, 16QAM, 64QAM modulation
  • Variable RF bandwidth, 1.4 - 20 MHz
  • Scheduling, link adaptation, HARQ and measurements similar to 3.5G
  • Random access procedures

Feedback
Copyright© ANRITSU