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BERTWave MP2100A

 
 BERTWave MP2100A
Features
  • All-in-one BER and Eye Pattern Measurements  
  • High-speed Remote Tests
  • Supports Electrical and Optical Interfaces
  • High-speed Mask Tests
  • Easy Operability, Flash Disk Drive, and Eco-friendly
  • All-in-one unit supporting simultaneous Jitter, Eye Pattern and Eye Mask measurements
  • Supports all WDP measurements
  • Simultaneous sampling and ideal Equalizer/Emphasis value calculation with Eye display
  • Simultaneous Eye Pattern, Eye Mask and Jitter Measurements for simulation waveform

The MP2100A is an all-in-one BERT and EYE/Pulse Scope solution for evaluating optical active devices in optical communication systems.
To meet the need for the fastest possible measurement speeds on production lines for active optical devices, the Gating Time has been slashed by 90% compared to conventional BERT equipment using remote commands and the EYE/Pulse Scope function is 300% faster. In addition, measurement times are much shorter due to the simultaneous BER measurement and EYE pattern analysis.


The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements. Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.

Adding the MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.

MATLAB® is a trademark of The MathWorks Inc.

 



  

Look at this comparison.

All-in-one PPG, ED, Scope, and Optical IF for incredible, space-saving compactness

 

 

 

>>>Click here for details about the BERTWAVE PE
supporting BER measurements.


>>>Click here for details about the BERTWAVE SS
supporting EYE/Pulse Scope measurements.

 

BERTS

 Operation bit rate With MP2100A/MP2101A-090 Without MP2100A/MP2101A-090

 PPG, ED Common;
 Variable bit-rate range (1 kbit/s step)
    8 Gbit/s to 12.5 Gbit/s

 1/N bit-rate operation range
    N=2:   4 Gbit/s to 6.25 Gbit/s
    N=4:   2 Gbit/s to 3.125 Gbit/s
    N=8:   1 Gbit/s to 1.5625 Gbit/s
    N=16: 500 Mbit/s to 781.25 Mbit/s
    N=32: 250 Mbit/s to 390.625 Mbit/s
    N=64: 125 Mbit/s to 195.312 Mbit/s

 PPG;
 Variable bit-rate range (1 kbit/s step)
    8.5 Gbit/s to 11.32 Gbit/s

 1/N bit-rate operation range
    N=2:    4.25 Gbit/s to 5.66 Gbit/s
    N=4:    2.125 Gbit/s to 2.83 Gbit/s
    N=8:    1.0625 Gbit/s to 1.415 Gbit/s
    N=16:  531.25 Mbit/s to 701.5 Mbit/s
    N=32:  265.625 Mbit/s to 353.75 Mbit/s
    N=64:  132.813 Mbit/s to 176.875 Mbit/s

 ED;
 Variable bit-rate range (1 kbit/s step)
    8.5 Gbit/s to 11.32 Gbit/s
    4.25 Gbit/s to 5.66 Gbit/s

 Test Pattern   PRBS: 27-1, 29-1, 215-1, 223-1, 231-1, (Invert ON/OFF),
 USER Data: 1.3 Mbit programmable (sample pattern file such as CJPAT and so on)
 Electrical Data Output  Data, Xdata
    Amplitude  0.1 Vp-p to 0.8 Vp-p
 Electrical Data Input  Data, Xdata (Option 001),
 Data (Option 003)
    Amplitude  0.1 Vp-p to 0.8 Vp-p
 O/E Input (Option 003)  Optical Data
    Wavelength Range  750 nm to 1650 nm
 XFP Slot (Option 050)   XFP Slot
 SFP+ Slot (Option 051)   SFP+ Slot

 

EYE/Pulse Scope

 Bandwidth (-3 dB)  DC to 20 GHz minimum, DC to 25 GHz Typical
 Display   Eye Pattern, Pulse Pattern
 Measurement Function  Statistical (NRZ),  Histogram, Mask Compliance
 Sampling Speed  100 K samples/sec, Typical
 O/E Input (Option 003)  Optical Data
    Wavelength Range  750 nm to 1650 nm
 Clock Recovery (Option 055)  0.1 GHz to 2.7 GHz, 8.5 GHz to 12.5 GHz

 

MX210001A Jitter Analysis Software

 Operating Conditions  Operates only when installed in MP2100A/MP2102A with correct license information
 The installer runs with V3.00.00 or later
 Other use conditions comply with MP2100A series
 The WDP runs under MATLAB R2010b SP1
 Measurement Algorithm  Histogram mode, Pattern Search mode
    Histogram mode  
       Measurement Items  TJ (1.0E-12), TJ (user defined), RJ (d-d), DJ (d-d), DDPWS, J2 jitter analysis, J9 jitter analysis,
 Eye opening
    Pattern Search mode  
       Measurement Items  TJ (1.0e-12), TJ (user defined), RJ (d-d), RJ (rms), DJ (d-d), PJ (p-p), DDJ (p-p), DCD, ISI (p-p),
 Eye opening, J2 jitter analysis, J9 jitter analysis, DDPWS, PJ Frequency
    WDP Measurement  Requires installation of MATLAB 2010b by MathWorks
       Measurement Items  WDP, dWDP, TWDP, dTWDP, WDPc, dWDPc, TWDPc, dWDPc

 

MX210002A Transmission Analysis Software

 Operating Conditions  Operates only when installed in MP2100A with correct license information
 The installer runs with V3.00.00 or later
 Other use conditions comply with MP2100A series
 Measurement Mode  Transmission analysis, Waveform estimation
    Transmission Analysis  
       Measurement Items  Gain graph, Phase graph, Group delay graph
 (Phase graph and Group delay graph switching display)
    Waveform Estimation  
       Equalizer Setting  Selects reflector, non-reflector at calculation
       Emphasis Format  2Post/1Pre, 3Post, 1Post/1Pre, 2Post, 1Post
       Device Character  Reads S2P File
       Jitter Analysis  Displays estimated waveform calculation results at MX210001A
 (when MX210001A installed in MP2100A)

---Cuts Measurement Times--- 


All-in-one BER and Eye Pattern Measurements

 

All-in-one BER and Eye Pattern Measurements

Simultaneous BER and EYE/Pulse Scope measurements using an all-in-one tester halve investment costs and cut measurement times. The tracking function supports easy BERT and EYE/Pulse Scope settings.

 


High-speed Remote Tests

 

High-speed Remote Tests

The built-in remote high-speed mode supports mixed remote functions for batch processing multiple commands and cuts BER measurement times by 30%*1 to 10 ms.

 


High-speed Mask Tests


High-speed Mask Tests

High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back

 


High-speed Mask Margin Tests



High-speed Mask Margin Tests

 

---Various Measurement Functions---


Wide Operation Frequency Range

 

Wide Operation Frequency Range

The BERT function supports bit rate from 125 Mbit/s to 12.5 Gbit/s (with Option-090) for evaluating devices and application supporting 100BASE-FX, GE-PON, CPRI, 10GFC, OUT-2 and etc.

 


Signal Integrity Analysis
The EYE/Pulse Scope supporting DC to 25 GHz offers signal integrity analysis using a variety of applications.



■Time and Amplifier Tests

Signal Integrity Analysis

These tests supports measurement of 0 and 1 levels, SNR, eye crosspoint ratio, eye amplification, eye height, eye width, jitter p-p values, jitter RMS, extinction ratio, rise and fall times, duty cycle distortion, and average power. In addition, the high-accuracy extinction ratio measurements close to ideal values are perfect for confirming the characteristics of optical modules.

 

■Histogram

Histogram

Measuring averages, standard deviation and scatter of data in a specified area supports waveform data component analysis and troubleshooting.

 

---High-accuracy Extinction Ratio Measurements---


Supports High-accuracy Extinction Ratio Measurements

 

■Excellent Bessel Filters

Excellent Bessel Filters

Bessel filters with the excellent frequency characteristics support high-accuracy extinction ratio measurement results.

 

---Jitter Analysis Function---


MX210001A Jitter Analysis Software

The ideal jitter analysis solution matching the application can be selected from either the histogram mode for measuring basic jitter analysis or the pattern search mode for detailed jitter analysis.

 









 

---Transmission Analysis Function---


MX210002A Transmission Analysis Software

Waveform simulation with transmission analysis (S21 Gain, Phase) functions as well as linearity, filtering and emphasis calculation supports simultaneous waveform sampling and simulation. The Eye pattern measurement and Eye mask test functions can also be used simultaneously.

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Optical Module Evaluations 

 

■Simultaneous TRx Measurements

One MP2100A supports both electrical and optical interfaces for performing simultaneous TRx evaluations of optical modules, cutting measurement times.

 

■High-speed Remote Tests

The built-in remote high-speed mode supports mixed remote functions for batch processing multiple commands and cuts BER measurement times by 30% to 10 ms.

 

■High-speed Mask Tests

High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back

 

 


Active Optical Cable Evaluation

 

Active Optical Cable Evaluation 

■Simultaneous 2-channel BER Measurements

Expansion of the BERTS to 2 channels supports easy simultaneous TRx measurements and crosstalk tests.

 

■All-in-one BER and Eye Pattern Measurements

Simultaneous BER measurements and eye-pattern analysis using an all-in-one tester does not require a separate BERTS and sampling scope, halving equipment costs.

 

■Wide Operation Frequency Range

The BERT function supports bit rate from 125 Mbit/s to 12.5 Gbit/s (with Option-090) for evaluating devices and application supporting 100BASE-FX, GE-PON, CPRI, 10GFC, OUT-2 and etc.

 


Physical Layer Evaluation for Transmission Equipment
Physical Layer Evaluation for Transmission Equipment

 

■Clock Recovery

The EYE/Pulse pattern Clock recovery function (Option-055) supports rates of 8.5 to 12.5 GHz and 0.1 to 2.7 GHz to perform mask tests for most applications.

 

■High-speed Mask Tests

High-speed sampling supports fast mask tests in about 12 s*, cutting measurement times.
(*) Typical value when capturing 1 x 106 samples at bit rate of 10.3125 Gbit/s with PRBS31 test pattern, back-to-back

 


Active Optical Cable (AOC) Measurements

The MX210001A supports simultaneous jitter analysis, Eye pattern measurement, and Eye mask tests required by high-speed and multi-lane Active Optical Cables (AOC). Moreover, high-speed triggering supports fast DDJ measurements, reducing measurement times by 80%.

 





 


Direct Attach Cable (DAC) Measurements

The Eye opening of passive cables like Direct Attach Cables (DAC) used for short connections between server racks, etc., can be assured using the equalizer built into the equipment Rx section. The MX210002A can be used to measure S21 Gain, Phase) characteristics of these devices. Moreover, since waveforms with optimized equalizer, filter, and emphasis values can be predicted from these transmission characteristics, Eye pattern measurement and Eye mask test of simulated waveforms can be performed.
In addition, combination with the MX210001A supports tests required for DAC manufacturing, such as Eye pattern measurement and jitter analysis, in one unit.

 

 


Emphasis Effect Simulation

The same 4-tap emphasis as the MP1825B 4 Tap Emphasis can be set. The type of Eye pattern measurement resulting from equalization and emphasis correction of a waveform with an Eye pattern measurement degraded by transmission path loss, or analysis using on-the-spot waveform simulation to determine the required equalization or emphasis can be fed back into the emphasis design.

 

 

>>>Back to top


MP2100A BERTWave

 

MP2100A BERTWave 

The MP2100A BERTWave is the all-in-one BERT and Eye/Pulse Scope measurement solution. Simultaneous BER measurement and Eye-pattern analysis cuts measurement times by eliminating time-consuming setup. The MP2100A series is the ideal all-in-one solution supporting both R&D and manufacturing.

 


MP2101A BERTWave PE

 

MP2101A BERTWave PE

The MP2101A BERTWave PE is the solution just for BER measurements. Expanding the BERTWave PE to 2 channels supports easy, efficient, simultaneous TRx measurements by eliminating complex line changes. Moreover, all-in-one support for PPG/ED crosstalk tests cuts measurement times and setup costs.

>>>Click here for details about the MP2101A BERTWave PE

 


MP2102A BERTWave SS

 

MP2102A BERTWave SS

The MP2102A BERTWave SS is the ideal solution just for high-speed EYE pattern analysis using the built-in clock recovery function which supports evaluation of the optical characteristics of long-distance transmission equipment and devices with no clock output. Built-in time/amplitude test, histogram analysis, and mask/mask margin test functions make it the perfect solution for signal quality analyses.

>>>Click here for details about the MP2102A BERTWave SS

 


Software

-Jitter Analysis Software-

The MX210001A Jitter Analysis Software has a new, high-speed, jitter-measurement function supporting all-in-one measurements, such as simultaneous jitter analysis, and Eye pattern measurement and Eye mask test measurements.
Moreover, the high-speed sampling increases measurement efficiency by cutting measurement time. And Combining the MX210001A with MATLAB supports WDP, TWDP and dWDP measurements for evaluating the waveform dispersion of specific signals.

>>>Click here for details about the MX210001A Jitter Analysis Software

 

-Transmission Analysis Software-

MX210002A Transmission Analysis Software to the BERTWave supports Tx analyses (S21 Gain, Phase), and waveform simulation (de-embedded) using linear equalizer, filter, and emphasis operations; simultaneous waveform sampling and simulation support simultaneous Eye pattern measurement and Eye mask test measurements. Furthermore, combined tracking with the MX210001A software permits simultaneous post-simulation waveform jitter measurement.

>>>Click here for details about the MX210002A Transmission Analysis Software

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