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Demonstration Uses Next-generation LTE Advanced Modem from Qualcomm Technologies and Anritsu MD8430A/RTD LTE Simulator
Luton, UK, 14 November 2014 - It was announced today that Anritsu, a global leader in wireless telecommunications test equipment, has further enhanced its winning Protocol Conformance Test (PCT) solution with leading test coverage in key technologies for Chinese carriers.
Signal Quality Analyzer Measures Jitter Tolerance of PHY Devices Supporting 100GbE, OIF-CEI 28G, InfiniBand EDR, and 32G Fibre Channel
Early availability of standard test case for the 3GPP’s eMBMS protocol will help networks to deploy broadcast services more quickly
ShockLine™ Family of Economical, High-performance VNAs Recognized for Filling Market Void
Separately, Anritsu extends capabilities of existing MT1000A handheld tester to include support for high-speed Fibre Channel and more detailed Ethernet testing
— New Interference Hunting System Simplifies Detection of Numerous Interferers Over Wide Range of Power Levels in Multiple RF Environments —
— MS46122A VNAs Address Passive Device Testing Requirements in Manufacturing, Engineering, and Education Environments —
MW82119B PIM Master™ Eliminates Need for Multiple Instruments by Combining 40W Battery-operated PIM Analyser with 2 MHz to 3 GHz Cable and Antenna Analyser
Luton, UK – 24th September 2014 – Anritsu is to demonstrate two contrasting series of Vector Network Analysers (VNAs) at it's stand 107 at European Microwave Week 2014 (7-9th October, Rome, Italy).
Anritsu Corporation today introduced a 32-channel synchronisation function for 32 Gbit/s data signals, an upgrade to its popular MP1800A Signal Quality Analyser.
Anritsu’s high-performance test systems for leading-edge optical research and for installation and maintenance of optical networks will be in the spotlight
Global Research Organization Cites Innovation and Customer Commitment as Key Reasons for Naming Anritsu Top T&M Field Solution Provider
Anritsu Provides a Single Test Solution for WLAN, Bluetooth, and Cellular to Lower the Cost of Test for Wireless Device Manufacturers
“All-round Easy-to-Use Test Tool for the Daily Operation Accelerates Transport Network Trouble Resolution”
Luton UK – July 15, 2014 – Anritsu Corporation has today announced that it has concluded a contract with Openreach, BT’s access network division, for the supply of fibre optic test equipment to support the deployment of advanced high speed fibre optic networks.
Atsugi, Japan, 10th July 2014 - It was announced today that Anritsu, a global leader in wireless telecommunications test equipment, is the leading supplier of the first industry approved protocol conformance test cases for mobile devices capable of receiving eMBMS broadcasts.
Luton, UK, 1st July 2014 - Anritsu are delighted to announce the appointment of Trescal MS as its sole certified service partner in Italy. This certification means that Trescal will be providing OEM backed calibration and repair services on Anritsu products via their network of labs through-out the country.
Copenhagen, Denmark – June 17, 2014: Anritsu A/S, a global provider of Operations Support Systems (OSS) for advanced and converged networks, announced today that its MasterClawTM Service Assurance system has been selected by Jasper Wireless, the leading platform powering the mobile Internet of Things.
VNA Master™ Handheld Vector Network Analyzer Part of Turnkey Solution Developed Exclusively for Education Community
Stockholm, 4 June 2014 - Anritsu Corporation and Teledyne LeCroy today announced they have signed an agreement providing for Anritsu to become an authorized reseller of Teledyne LeCroy products in Sweden
Combination of Test Set, Dual Source and DifferentialView Creates Test Solution with Most Advanced Capabilities for Measuring Differential Devices
Family of remote-control 2- and 4-port VNAs ideal for testing passive devices in production, design and education
Anritsu’s ME7834 Protocol Conformance Test system has the highest number of approved IMS test cases for device certification of any test platform, as confirmed at the recent Global Certification Forum (GCF) CAG#38 meeting in Taipei held in April.
Innovative ME7838A VNA Solution to be Used by Leading Laboratory in Development of Standards for On-wafer S-parameter Calibration
New Clock Recovery Function Options for MP1800A Signal Quality Analyzer (SQA) Allows a 32 Gbit/s High-Sensitivity Bit Error Rate (BER) Testing with a Single Instrument
Japan, April 22 2014 - Anritsu Corporation has announced that the company’s ME7873L RF Conformance Test System has become the world-first GCF approved test system to achieve the key milestone of more than 80% test cases supporting Japanese (Band 1-18, Band 1-26), and US (Band 4-13) frequency band combinations for Carrier Aggregation.
VectorStar™ ME7838D Brings Industry-leading Frequency Coverage, Dynamic Range, Stability, and Measurement Speed to On-wafer Applications
Luton, UK – April 8, 2014 – Anritsu announce today, Fraunhofer Institute for high frequency physics and radar technology FHR in Wachtberg, Germany has decided to use the world's first 145 GHz broadband millimetre-wave test system, based upon the ME7838A system from Anritsu.
Innovative Design of VectorStar™ ME7838E System Allows for Best-in-Class Performance in On-wafer Applications
Luton, UK – 27 March 2014, Mobile device and handset manufacturers can soon certify that their products conform to the 3GPP protocols for ‘emergency services calls over IMS’ with the introduction by Anritsu of the first PTCRB-approved test case.
S412E Handheld Analyzer Allows Field Engineers, Technicians to Diagnose and Troubleshoot TETRA Networks Quickly and Easily
— New Option for MS2720T Provides Excellent Frequency Accuracy Without Need for GPS in Regulatory Compliance Applications —
Anritsu demonstrates the MD8430A operating at 300Mbps downlink and 50Mbps uplink/s with Intel® XMM™ 7260 platform at Mobile World Congress
Luton, UK – 20th February 2014 – Anritsu Company today announced that it has validated 100% of the tests required by NTT DoCoMo for summer 2014 model mobile phones, using the flexible ME7834L Mobile Device Test Platform.
Copenhagen, Denmark - 20th February 2014: Anritsu A/S, a global provider of Operations Support Systems (OSS) for advanced and converged networks, announced today that they have been selected by a large multinational group of CSPs to supply next generation E2E monitoring.
Copenhagen, Denmark - 20th February 2014: Anritsu A/S, a global provider of Operations Support Systems (OSS) for advanced and converged networks, announced today that they have signed a multi-year frame agreement to supply next generation E2E monitoring with a large Latin American CSP.
Luton, UK – 18th of February - Anritsu Corporation and Sequans are presenting a live demonstration of eMBMS, or LTE Broadcast technology, at Mobile World Congress in Barcelona, together with Expway.
Japan – 13th of February - Anritsu Corporation is pleased to announce the company’s ME7873L RF Conformance Test System has become the world’s first GCF-approved mobile test system to achieve more than 80% of test cases approved for LTE-Advanced Carrier Aggregation.
Luton, UK – 11th February 2014 – Anritsu Corporation has announced that they are now approved by LTE chipmaker Sequans Communications for using the MT8870A Universal Wireless Test Set as an advanced manufacturing test solution of LTE devices based on Sequans’ Mont Blanc LTE platform.
Demonstration Uses Qualcomm Gobi 9x35 Modem and Anritsu
MD8430A LTE Simulator
Demonstration Uses Qualcomm Gobi 9x35 Modem and Anritsu MD8430A LTE Simulator
Microwave Site Master™ S820E Continues Wireless Handheld Test Leadership Position Anritsu Established More Than 15 Years Ago
Luton, UK – 15th January 2013 – This year at Mobile World Congress (24-27 February 2014) Anritsu will be showcasing a selection of their leading LTE test and monitoring solutions on their booth (Hall 6 Booth 6F40) for every aspect of testing from handsets to base stations and networks.
Anritsu today announced that Chalmers University in Sweden has selected Anrtisu’s ME7838A broadband mm-wave test system to provide measurements supporting the development of new, high-frequency devices and components.